To keep pace with an increase in the demand for high-performance optical components, producers will need to consider automation of their processes in more detail. Dylan J. Burke of Yelo – a firm specialising in automated device measurement – looks at what’s driving the market and discusses the challenges that device makers face in relation to burn-in and test of devices at high volume. Included in his review are examples of the developments Yelo has been working on to help PIC firms in ramping up production.