From 5-8 March 2017, Matthew Boyd, Mechanical Design Engineer at Yelo was in attendance at the Burn-in and Test Strategies (BITS) Workshop in Arizona.
From 5-8 March 2017, Matthew Boyd, Mechanical Design Engineer at Yelo was in attendance at the Burn-in and Test Strategies (BITS) Workshop in Arizona.
Last week (21-23 March 2017) Yelo appeared at The Optical Fiber Communication Conference (OFC) and Exhibition in Los Angeles. This year’s show was one of the largest with 663 exhibiting companies and 14,500 attendees.
Yelo were in attendance at the second annual PIC International Conference in Brussels (7-8th March 2017).
Laser diode burn-in and life test equipment manufacturers Yelo were in attendance at the EPIC (European Photonics Industry Consortium) meeting on PIC Testing in Pisa last week (16-17 February 2017).
To keep pace with an increase in the demand for high-performance optical components, producers will need to consider automation of their processes in more detail. Dylan J. Burke of Yelo – a firm specialising in automated device measurement – looks at what’s driving the market and discusses the challenges that device makers face in relation to burn-in and test of devices at high volume. Included in his review are examples of the developments Yelo has been working on to help PIC firms in ramping up production.