Burn-in & Life-test, and Qualification Systems
With high device counts in compact chambers, you will be able to increase throughput and make your test activities more efficient. Devices can be tested when either packaged or in chip-on-carrier form.
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Yelo's Burn-in & Life-test, and Qualification Systems are composed of tightly-controlled temperature environments that can perform component testing either on a continuous basis, or at the end of the burn-in period.
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This modular, flexible system is available in 2 options:
- The low-power option can be used for low-quantity testing in the laboratory, but it can also be easily scaled to test up to 2,048 devices in production. This flexibility also allows for simultaneous testing in up to 128 different temperature zones.
- The high-power option can test up to 960 devices in production, in up to 320 different temperature zones simultaneously.
Features:
- Number of drawers per rack: 1 to 4
- Flexible fixturing able to handle most device types
- All power supplies are built-in
- Supports up to 128 temperature zones
- Voltage/Current/Light output spot measurements
- Number of devices under test: up to 2,048 in 1 to 4 racks
- 128 devices per drawer (grouped in modules of 16), each module with fully independent temperature control on its own hot plate
- Laser voltage range 0.5 V to 10 V, 0 to 200 Amps
- Chilled air option allows the module to be operated at below ambient
- Flexible, intuitive user interface programmed with LabVIEW™
Benefits:
- Standard or tailor-made fixturing offers full flexibility
- High quality instrumentation can be swapped out for periodic re-calibration
- Small footprint
- Provides complete datalogging of all results in ODBC-compliant databases
- Modular construction enables easy maintenance
- Low cost by design due to integration of separate ovens and control electronics
Yelo's Burn-in & Life-test and Qualification Systems have been successfully implemented in the following applications:
- Production burn in for high-volume laser products
- Burn-in & Life-test for VCSELs / edge emitters / PIN and APD detectors
- Production test systems for bi-directional telecommunication components
- Burn-in testing for complex tunable laser products
Probed Burn-in:
Yelo's latest technology allows for the burn-in of laser/photodiode bars. By incorporating our high accuracy semiconductor tungsten probing methods, aligned to device contact pads, Yelo can achieve high device count burn-in whilst retaining all of the control and measurement of our standard system.
This novel approach allows our customers to push back the cost of burn-in of their dvices to lower cost components.
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